Artificial-neural-network descriptor enhancing accuracy of machine-learning interatomic potential and its application to lattice defects in Si
M. Uchida, T. Yokoi, Y. Ogura, and K. Matsunaga
Phys. Rev. Materials 8, 103805 (2024) - Published 21 October, 2024
Trainable descriptors based on artificial neural networks (ANNs) are presented with the goal of accurately predicting the structure-property relationship in the presence of various lattice defects for Si. In this architecture, interatomic distances and bond angles are directly fed to the ANNs instead of empirical analytic functions. The ANNs are hierarchically connected with another ANN that outputs the atomic energy involving many-body terms of the potential energy. All ANNs are then simultaneously trained using density-functional-theory data, which enables updating the entire functional forms numerically. For training and test datasets containing point defects, surfaces, and grain boundaries in Si, the ANN descriptor exhibits systematically smaller errors in total potential energy than those based on the symmetry function and the Chebyshev polynomials, which are commonly used in ANN potentials. The outputs of the trained descriptor each have flexible functional forms that are difficult to construct using a single separation-of-variable function in terms of the interatomic distance and the bond angle. This indicates that the ANN descriptor can acquire a better representation of diverse atomic environments via the training, which leads to the decreased error. The present study also discusses an efficient way of training the ANN descriptor in a stepwise manner while maintaining its flexibility. Furthermore, the computational time is found to be comparable to that of the symmetry function, which will pave the way for large-scale molecular simulations involving multiple lattice defects with high accuracy.