Nature of electronic conduction in heterostructures
Xin Yu Zheng, Mike J. Veit, and Yuri Suzuki
Phys. Rev. Materials 9, 014005 (2025) - Published 21 January, 2025
Interfaces of complex oxides host a rich variety of phenomena and exotic phases not found in their bulk counterparts. The (LTO/STO) system is particularly interesting due to multiple conduction channels such as the LTO, interfacial, and partial reduction of STO. To date, the extent of the conducting region has not been quantified but is critical for a fundamental understanding of the LTO/STO system. Here, we quantify the 2DEG thickness in LTO/STO through Sondheimer oscillations in the longitudinal magnetoresistace. By analyzing the LTO thickness dependence of these oscillations, we estimate that the 2DEG penetrates the STO substrate by approximately 2.8 nm, indicating that the metallic bulk LTO is not the sole contributor to metallicity. This work provides the first quantitative estimate of the STO conduction depth in LTO/STO using Sondheimer oscillations and provides critical insight into the complex conduction pathways in LTO/STO previously considered to be a simple 2DEG.
