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  • Letter
  • Open Access

Linear dichroic soft x-ray microscopy of ferroelectric stripe domains in epitaxial K0.6Na0.4NbO3

M. Schneider1, T. A. Butcher1,*, S. Wagner1, D. Metternich1,2,3, C. Klose1, E. Malm4, R. Battistelli2,3, V. Deinhart1, J. Fuchs1 et al.

S. Wittrock2, T. Karaman2,3, K. Puzhekadavil Joy2,3, M. Patra2,3, F. Büttner2,3, S. Wintz2, M. Weigand2, C. M. Günther5, D. Engel1, P. Gaal6,7, J. Schwarzkopf6, B. Pfau1, and S. Eisebitt1,8

  • *Contact author: tim.butcher@mbi-berlin.de

Phys. Rev. B 114, L231401 – Published 2 October, 2026

DOI: https://doi.org/10.1103/kcjc-dtj6

Abstract

Functional properties of ferroelectric thin films are governed by domains that can be engineered by epitaxial strain. Soft x-ray microscopy can image domain structures with elemental and electronic sensitivity, but hitherto its application to strain-stabilized domains has been hindered by the absorption of soft x-rays in epitaxial substrates. Here, it is demonstrated how this limitation can be overcome by locally back-thinning the (110) TbScO3 substrate of epitaxial K0.6Na0.4NbO3 ferroelectric thin films to achieve soft x-ray transparency at the O K-edge around 530 eV. Strain-induced ferroelectric stripe domains with periods down to 44 nm were resolved by scanning transmission x-ray microscopy and coherent diffractive imaging by exploiting the x-ray linear dichroism of hybridized O 2p–Nb 4d states, providing sensitivity to in-plane polarization components under normal incidence. The results establish soft x-ray microscopy for nanoscale imaging of epitaxial ferroelectric domain structures and open perspectives for time-resolved studies thereof.

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