Yuejie Xin1,2, Sean L. M. van der Meer1,2, Marc Serra-Peralta1,3, Tim H. F. Vroomans1,2, Matvey Finkel1,2, Hendrik M. Veen1,2,†, Marc W. Beekman4, and Leonardo DiCarlo1,2,*
Arijit Das and Masaki Owari
IEEE Access 14 156159 (2026)