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Physical Review Research

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Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering

Chen Shen (沈辰)^1,*, Honghu Zhang (张洪湖)², Beate Klösgen ^1,3, and Benjamin M. Ocko ^2,†

¹Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
²National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
³Department of Physics, Chemistry and Pharmacy & PhyLife, University of Southern Denmark, Campusvej 55, 5230 Odense, Denmark

^*Contact author: chen.shen@desy.de
^†Contact author: ocko@bnl.gov

Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations

Kay-Robert Dormann, Joshua Reed, Chen Shen, Daniel Mitlewski, Matej Kanduč, Benno Liebchen, and Emanuel Schneck

Langmuir 42 16180 (2026)

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