Articles Citing

Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering

Chen Shen (沈辰)^1,*, Honghu Zhang (张洪湖)², Beate Klösgen ^1,3, and Benjamin M. Ocko ^2,†

¹Deutsches Elektronen-Synchrotron DESY, Notkestraße 85, 22607 Hamburg, Germany
²National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
³Department of Physics, Chemistry and Pharmacy & PhyLife, University of Southern Denmark, Campusvej 55, 5230 Odense, Denmark

^*Contact author: chen.shen@desy.de
^†Contact author: ocko@bnl.gov

Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations

Kay-Robert Dormann, Joshua Reed, Chen Shen, Daniel Mitlewski, Matej Kanduč, Benno Liebchen, and Emanuel Schneck

Langmuir 42 16180 (2026)

X-ray Measurements of the Structure and Surface Excess of Perfluorooctanoic Acid Monolayers at the Air-Water Interface

Andrew P. Wright, Honghu Zhang, Srikant K. Singh, Samantha Freeman, Chen Shen, Charles Maldarelli, Arjun K. Venkatesan, Benjamin S. Hsiao, and Benjamin M. Ocko

Journal of Colloid and Interface Science 141874 (2026)

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Articles Citing

Extending the capillary wave model to include the effect of bending rigidity: X-ray reflectivity and diffuse scattering

Quantifying Surfactant Adsorption at Fluid Interfaces by Combining X-ray Reflectivity and Simulations

X-ray Measurements of the Structure and Surface Excess of Perfluorooctanoic Acid Monolayers at the Air-Water Interface

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