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Experimental device-independent efficient certification of unsharp measurements

Wei Zhou1,*, Xinhui Li1,*,†, Ran Yang1, Linrunde Tao1, Yi-Chen Liu2, Zhenda Xie1, Yan-Xiao Gong1,3,‡, and Shi-Ning Zhu1

  • 1National Laboratory of Solid State Microstructures, School of Physics, School of Electronic Science and Engineering, and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
  • 2Research Center for Quantum Optics and Quantum Communication, School of Science, Qingdao University of Technology, Qingdao 266525, China
  • 3Hefei National Laboratory, Hefei 230088, China

  • *These authors contributed equally to this work.
  • †Contact author: lixinhui@nju.edu.cn
  • ‡Contact author: gongyanxiao@nju.edu.cn

Robust device-independent characterization of sharpness and incompatibility of unsharp instruments

Qian Zhang, Kai-Yu Yuan, Yan-Xin Rong, Zhen Shang, Yong-Jian Gu, and Ya Xiao

Phys. Rev. A 114 022411 (2026)

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