Heterogeneous transfer of thin film onto silicon
Phys. Rev. Materials 10, 093804 – Published 22 September, 2026
DOI: https://doi.org/10.1103/vsr2-wd6w
Abstract
Thin film has one of the highest known Pockels coefficients ( pm/V), making it an attractive material for use in electro-optic devices. It is advantageous to integrate onto silicon to enable complementary metal-oxide-semiconductor (CMOS) compatible processing. However, synthesis of high-quality directly on silicon remains a challenge. Here, we synthesize using hybrid metal-organic molecular beam epitaxy (hMBE) and demonstrate its transfer onto silicon using thermocompression bonding and chemical lift off. Hybrid metal-organic MBE enables self-regulated synthesis of highly stoichiometric thin films at high growth rates ( nm/hr). Our transfer method results in millimeter-scale areas of atomically flat, crack-free making it a potentially scalable method. Finally, we demonstrate the robustness of our transferred thin films to fabrication processes required to make devices through characterization of lithographically patterned and etch-transferred submicron features.