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    Heterogeneous transfer of thin film BaTiO3 onto silicon

    Temazulu S. Zulu1, Larissa B. Little1,2, Aaron M. Day1,2,3, Chaoshen Zhang2, Keith Powell2, Kyeong-Yoon Baek1, Benazir Fazlioglu-Yalcin1, Neil Sinclair2, Charles M. Brooks1 et al.

    David R. Barton4, Marko Lončar2, and Julia A. Mundy1,2,*

    • *Contact author: mundy@fas.harvard.edu

    Phys. Rev. Materials 10, 093804 – Published 22 September, 2026

    DOI: https://doi.org/10.1103/vsr2-wd6w

    Abstract

    Thin film BaTiO3 has one of the highest known Pockels coefficients (>1200 pm/V), making it an attractive material for use in electro-optic devices. It is advantageous to integrate BaTiO3 onto silicon to enable complementary metal-oxide-semiconductor (CMOS) compatible processing. However, synthesis of high-quality BaTiO3 directly on silicon remains a challenge. Here, we synthesize BaTiO3 using hybrid metal-organic molecular beam epitaxy (hMBE) and demonstrate its transfer onto silicon using thermocompression bonding and chemical lift off. Hybrid metal-organic MBE enables self-regulated synthesis of highly stoichiometric thin films at high growth rates (>100 nm/hr). Our transfer method results in millimeter-scale areas of atomically flat, crack-free BaTiO3 making it a potentially scalable method. Finally, we demonstrate the robustness of our transferred thin films to fabrication processes required to make devices through characterization of lithographically patterned and etch-transferred submicron features.

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