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    Scaling of long-range loop-erased random walks

    Tianning Xiao1,*, Xianzhi Pan2,*, Zhijie Fan1,3,4,†, and Youjin Deng1,2,3,‡

    • *These authors contributed equally to this work.
    • †Contact author: zfanac@ustc.edu.cn
    • ‡Contact author: yjdeng@ustc.edu.cn

    Phys. Rev. E 114, 054110 – Published 5 November, 2026

    DOI: https://doi.org/10.1103/qnhv-yp69

    Abstract

    We study the scaling properties of long-range loop-erased random walks (LR-LERW), where the underlying random walker performs Lévy-flight-like jumps with a power-law step-length distribution P(r)∼|r|−(d+σ). Using extensive Monte Carlo simulations, we measure the scaling relation N∼RdN between the loop-erased step number N and the spatial extent R, and determine the geometric exponent dN for various values of σ in spatial dimensions d=1,2, and 3, as well as at the marginal point σ=2 in d=4 and 5. We observe a continuous crossover from long-range (LR) to short-range (SR) behavior as σ increases. Below the upper critical dimension d<dc=4, for σ<d/2, loop erasure is asymptotically irrelevant and dN=σ, consistent with Lévy-flight scaling. For d/2<σ<2, loop erasure becomes relevant and dN varies continuously toward the short-range loop-erased random walks value. At the marginal points with σ=d/2 or σ=2, clear logarithmic corrections are observed. At and above the upper critical dimension, d≥4, the scaling at σ=2 is found to be N∼R2/lnR, consistent with that of the corresponding Lévy flight. Our results provide a systematic numerical determination of dN(σ) for the LR-LERW across dimensions, and are consistent with σ*=2 as the boundary between LR and SR critical behaviors recently established in a broad variety of statistical models.

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