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    Controlled dust mobilization on a solid surface with grazing electron beam incidence

    Sean Gopalakrishnan1,2, Xu Wang1,2, Mihály Horányi1,2, Vladimir Kvon3, Manis Chaudhuri3, Andrei Yakunin3, Luuk Heijmans3, Hariprasad Gangadharan3, Pavel Krainov4 et al.

    Dmitry Astakhov4

    Phys. Rev. E 113, 035210 – Published 24 March, 2026

    DOI: https://doi.org/10.1103/c8nd-1lxg

    Abstract

    We present experimental results of dust mobilization on a solid surface under an electron beam with grazing incidence. When the electron beam energy has a secondary electron yield greater than 1, dust particles move in the opposite direction of the electron beam. This is caused by asymmetric charging between the beam-facing and beam-shadowed sides of the particles. On the beam-facing side, the microcavity between a dust particle and the substrate surface collects beam electrons and emits beam-induced secondary electrons. In contrast, on the beam-shadowed side, the microcavity mainly collects secondary electrons. It is shown that the charge magnitude on the beam-shadowed side is larger than that on the beam-facing side, resulting in a net repulsive force pointing in the opposite direction of the beam to move the particle. When the beam energy has a secondary electron yield smaller than 1, the beam-facing side charged by primary beam electrons and the beam-shadowed side charged by backscattered beam electrons reach a similar potential close to the beam energy, resulting in the dust particles moving in random directions. These experimental results show agreement with particle-in-cell simulations.

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