Articles Citing

In situ straining of epitaxial freestanding ferroic films by a microelectromechanical device

Simone Finizio ^1,*, Tim A. Butcher ^1,2,†, Maria Cocconcelli ³, Elisabeth Müller ¹, Lauren J. Riddiford ^1,4, Jeffrey A. Brock^1,4, Chia-Chun Wei⁵, Li-Shu Wang⁵, Jan-Chi Yang^5,6 et al.

Shih-Wen Huang¹, Federico Maspero ³, Riccardo Bertacco³, and Jörg Raabe ¹

¹Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
²Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, 12489 Berlin, Germany
³Dipartimento di Fisica, Politecnico di Milano, 20133 Milano, Italy
⁴Laboratory for Mesoscopic Systems, Department of Materials, ETH Zurich, 8093 Zurich, Switzerland
⁵Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan
⁶Center for Quantum Frontiers of Research & Technology (QFort), National Cheng Kung University, Tainan 70101, Taiwan

^*Contact author: simone.finizio@psi.ch
^†Contact author: tim.butcher@mbi-berlin.de

Linear dichroic soft x-ray microscopy of ferroelectric stripe domains in epitaxial K0.6Na0.4NbO3

M. Schneider, T. A. Butcher, S. Wagner, D. Metternich, C. Klose, E. Malm, R. Battistelli, V. Deinhart, J. Fuchs, S. Wittrock, T. Karaman, K. Puzhekadavil Joy, M. Patra, F. Büttner, S. Wintz, M. Weigand, C. M. Günther, D. Engel, P. Gaal, J. Schwarzkopf, B. Pfau, and S. Eisebitt

Phys. Rev. B 114 L231401 (2026)

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Physical Review B

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In situ straining of epitaxial freestanding ferroic films by a microelectromechanical device

Linear dichroic soft x-ray microscopy of ferroelectric stripe domains in epitaxial K0.6Na0.4NbO3

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