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    Revealing charge transfer in defect-engineered 4Hb−TaS2

    Siavash Karbasizadeh1,2,*, Wooin Yang2,3, Wonhee Ko3,4, Haidong Zhou3, An-Ping Li2, Tom Berlijn2,†, and Sai Mu1,‡

    • *Contact author: siavashk@email.sc.edu
    • †Contact author: berlijnt@ornl.gov
    • ‡Contact author: mus@mailbox.sc.edu

    Phys. Rev. B 114, 204107 – Published 22 October, 2026

    DOI: https://doi.org/10.1103/tls3-873z

    Abstract

    We present a comprehensive first-principles investigation of defects in 4Hb−TaS2. In this layered transition metal dichalcogenide, charge transfer between alternating Mott-insulating 1T and metallic 1H layers gives rise to exotic quantum phases such as the Kondo effect and topological superconductivity. Motivated by recent defect manipulation in 4Hb−TaS2 via STM, we address their microscopic nature and impact on interlayer charge transfer. To this end, we systematically analyze over 90 defects using large-scale density functional theory (DFT) calculations. Our analysis identifies 1H sulfur vacancies, Ta-on-S antisites, and Ta interstitials as the most likely origins of the commonly observed defects, with Ta-on-S antisites producing the strongest charge-transfer modulation. Our extensive dataset, compiled from STM simulations, defect formation energies, work functions, and charge transfer, establishes a foundational resource for future theoretical and experimental studies on defect engineering in 4Hb−TaS2.

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