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  • Open Access

Quantifying stress states of theoretically modeled polarimetric measurements on dielectric media

Felix B. Müller* and Georgios Ctistis†

  • *Contact author: felix.mueller@ifnano.de
  • †Contact author: georgios.ctistis@ifnano.de
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Phys. Rev. Applied 24, 034035 – Published 15 September, 2025

DOI: https://doi.org/10.1103/rh94-jdw2

Abstract

This work introduces and characterizes a theoretical model of a reflective polarimetric measurement technique determining the surface stress of a dielectric material, e.g., glass. We have developed a procedure to reconstruct the actual stress state from calculated Stokes vector components that would appear as polarization signals in a measurement. For the calculation, we consider a special geometry of the principal stress axis, where we chose the third principal axis corresponding to the z axis to be perpendicular to the surface and relaxed to a zero value. A created database represents the dependence of the reflected Stokes vector on the initial Stokes vector and the stress states included in the reflection matrix, which is iteratively calculated for several stress components and their orientations. The introduction of a model for the dependency of the reflected Stokes vector components on the stress states and the fitting of it to the database results in a system of equations of those dependencies that are solved for the stress state components and orientation. Finally, we found the theoretical determination accuracy of the model for surface stress magnitude to be on the order of a few megapascals and the orientation of the principal axes of stress can be determined with an accuracy of 20∘.

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Phys. Rev. Applied 24, 034035– Published 15 September, 2025
  • Received 18 December 2024
  • Revised 9 May 2025
  • Accepted 11 July 2025
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