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Competition between one- and two-photon processes in Ar irradiated by the Shanghai soft x-ray free electron laser

Ruichao Dong1,2,7,*, Jie Yan3,4,*, Jinze Feng2, Mingjie Zhang1,7, Yikang Zhang2, Yuliang Guo2, Ahai Chen2, Zhenjie Shen2, Yuneng Shen2 et al.

Zhen Wang1, Kaiqing Zhang1, Xuan Li1, Zheng Qi1, Zhangfeng Gao1, Zenggong Jiang1, Jiaming Jiang2, Bin Li1, Chao Feng1, Bo Liu1, Huaidong Jiang2, Zhi Liu2, Yajiang Hao5, Kiyoshi Ueda2,8, Cheng Gao4,†, Xincheng Wang2,‡, and Yuhai Jiang2,6,1,§

  • *These authors contributed equally to this work.
  • †Contact author: gaocheng@nudt.edu.cn
  • ‡Contact author: wangxch1@shanghaitech.edu.cn
  • §Contact author: jiangyh3@shanghaitech.edu.cn

Phys. Rev. Research 7, 033174 – Published 21 August, 2025

DOI: https://doi.org/10.1103/j4rx-55m2

Abstract

Shanghai Soft X-ray Free Electron Laser facility has entered user operation, delivering soft x-ray pulses in self-amplified spontaneous emission mode with an intensity of the peak fluence of ∼1.0×10−2µJ/µm2 at a focus point. With these conditions, at a photon energy of 260 eV, we expect sequential processes in which Ar2+ created by the Auger decay following the 2p photoionization may be resonantly excited to the 2p−13p−23d inner-shell excited state and thus resonant Auger decay produces Ar3+, which can also be competitively produced by the direct double Auger decay (DDAD) following the one-photon 2p ionization of Ar. Ar4+ ions dominantly arise from Ar2+ with a resonant excitation and subsequent DDAD, involving two-photon absorption. The measured charge distributions as a function of the free-electron laser (FEL) fluence are well reproduced by ab initio calculations that include DDAD, normally neglected in the previous FEL studies, and resonant Auger decay. The present results demonstrate that the low peak fluence of the FEL pulses can be determined if the competition between the one- and two-photon processes is precisely described along with DDAD and resonant Auger decay.

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