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  • Letter
  • Open Access

Electronic bonding transitions in oxide glass above two megabar pressures

Yong-Hyun Kim1, Paul Chow2, Yuming Xiao2, Guoyin Shen2, and Sung Keun Lee1,3,*

  • *Corresponding author: sungklee@snu.ac.kr
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Phys. Rev. Research 6, L022051 – Published 3 June, 2024

DOI: https://doi.org/10.1103/PhysRevResearch.6.L022051

Abstract

Inelastic x-ray scattering (IXS) of B2O3 glass up to ∼2.2 Mbar reveals electronic bonding transitions in oxide glasses. B K-edge IXS identifies the high-energy feature above ∼1.4 Mbar and a gradual increase in its intensity toward ∼2.2 Mbar, indicating the formation of hypervalent boron via electron polarization to oxygen atoms. The pressure-driven high energy shifts in O K-edge IXS indicate pronounced electronic dispersion that increases upon densification of amorphous oxides above ∼2 Mbar. The extent of the energy shifts and enhanced polarization correlate with increasing atomic radius of cation in oxide glass, establishing the role of cation radius in electronic structures of amorphous oxides under compression. The results elucidate the electronic mechanisms behind the delayed structural transformation in low-Z oxide glasses, where transitions to highly coordinated cations are hindered well above 1 Mbar, providing the origin of incompressibility of low-Z amorphous oxide under multi-Mbar compression.

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Phys. Rev. Research 6, L022051– Published 3 June, 2024
  • Received 13 December 2023
  • Revised 22 March 2024
  • Accepted 6 May 2024
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