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  • Letter
  • Open Access

X-ray two-beam topography for quantitative derivation of phase shift by crystalline dislocations

Yoshiki Kohmura1, Kenji Ohwada2, Nobuki Kakiuchi3, Kei Sawada1, Tadaaki Kaneko3, Jun'ichiro Mizuki3, Masaichiro Mizumaki4, Tetsu Watanuki2, and Tetsuya Ishikawa1

  • 1RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-gun, Sayo-cho, Hyogo 679-5148, Japan
  • 2Synchrotron Radiation Research Center, Kansai Photon Science Institute, Quantum Beam Science Research Directorate, National Institutes for Quantum Science and Technology, SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan
  • 3School of Science and Technology, Kwansei Gakuin University, 1 Gakuen Uegahara, Sanda, Hyogo 669-1330 Japan
  • 4Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan

Phys. Rev. Research 5, L012043 – Published 23 March, 2023

DOI: https://doi.org/10.1103/PhysRevResearch.5.L012043

Abstract

Quantitative evaluation of crystalline dislocations is gaining importance in order to realize functional materials with ultimate performance. X-ray topography has been an important tool to evaluate the crystalline dislocations in bulk in a large volume, but the research up to now lacks the analysis to derive the phase at the image plane and such a situation prevents us from obtaining knowledge of lattice planes around the crystalline dislocations. Here we report a method that enables us to obtain such knowledge in a crystal using an x-ray two-beam topography at the kinematical diffraction regime. It can quantitatively derive the phase shift by the Bragg reflection around the crystalline dislocations. We observed an x-ray vortex wave field from a silicon carbide crystal containing a screw dislocation which almost perfectly agrees with simulations. This method will clarify the distribution and network of the threading screw dislocations and other dislocations in a large field of view.

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References (21)

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