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Topological extraordinary optical transmission

K. Baskourelos1, O. Tsilipakos2, T. Stefański3, S. F. Galata4, E. N. Economou2,5, M. Kafesaki2,6, and K. L. Tsakmakidis1,*

  • 1Section of Condensed Matter Physics, Department of Physics, National and Kapodistrian University of Athens, Panepistimioupolis, GR-157 84 Athens, Greece
  • 2Institute of Electronic Structure and Laser, Foundation for Research and Technology Hellas, Heraklion, Crete GR-70013, Greece
  • 3Gdańsk University of Technology, Faculty of Electronics, Telecommunications and Informatics, ul. G. Narutowicza 11/12, 80-233 Gdańsk, Poland
  • 4Department of Electrical and Electronic Engineering, University of West Attica, Egaleo, 12244, Greece
  • 5Department of Physics, University of Crete, GR-70013 Heraklion, Crete, Greece
  • 6Department of Materials Science and Technology, University of Crete, GR-70013 Heraklion, Crete, Greece

  • *To whom correspondence should be addressed: ktsakmakidis@phys.uoa.gr

Phys. Rev. Research 4, L032011 – Published 25 July, 2022

DOI: https://doi.org/10.1103/PhysRevResearch.4.L032011

Abstract

Τhe incumbent technology for bringing light to the nanoscale, the near-field scanning optical microscope, has notoriously small throughput efficiencies of the order of 104 −105, or less. We report on a broadband, topological, unidirectionally guiding structure, not requiring adiabatic tapering and, in principle, enabling near-perfect (∼100%) optical transmission through an unstructured single arbitrarily subdiffraction slit at its end. Specifically, for a slit width of just λeff/72 (λ0/138) the attained normalized transmission coefficient reaches a value of 1.52, while for a unidirectional-only (nontopological) device the normalized transmission through a λeff/21 (∼λ0/107) slit reaches 1.14; both limited only by inherent material losses, and with zero reflection from the slit. The associated, under ideal (ultralow-loss) conditions, near-perfect optical extraordinary transmission has implications, among diverse areas in wave physics and engineering, for high-efficiency, maximum-throughput nanoscopes and heat-assisted magnetic recording devices.

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