Articles Citing

Atomic resolution imaging of the strength and 3D direction of atomic displacements in functional oxide thin films

¹School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom
²Ernst Ruska-Centre (ER-C 2), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
³Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 OFS, United Kingdom
⁴DEMCON high tech systems Eindhoven BV, Kanaaldijk 29, 5683 CR Best, The Netherlands
⁵electron Physical Science Imaging Centre, Diamond Light Source Ltd., Didcot OX11 0DE, United Kingdom
⁶Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom

Ian Maclaren, Aurys Silinga, Juri Barthel, Josee Kleibeuker, Judith L MacManus-Driscoll, Christopher S. Allen, and Angus I. Kirkland

Phys. Rev. Materials 9 094404 (2025)

Ian MacLaren, Andrew T. Fraser, and Matthew R. Lipsett

Phys. Rev. Materials 9 123602 (2025)

Nidhi Choudhary, Silke A. Peeters, Ciaran T. Lennon, Dmytro Besprozvannyy, Harm C. M. Knoops, Ian Maclaren, and Robert H. Hadfield

APL Materials 13 111104 (2025)

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