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    Deep level of SnZn antisites compensated by oxygen dopants near the interface of Cu2ZnSnS4 and Zn(O,S)

    Ho Ming Chan, Kin Pong Ao, Kejie Bao, Man Yin Sheung, and Junyi Zhu*

    • *Contact author: jyzhu@phy.cuhk.edu.hk

    Phys. Rev. Materials 10, 015401 – Published 14 January, 2026

    DOI: https://doi.org/10.1103/z8qf-5h26

    Abstract

    Cu2ZnSnS4 (CZTS) is a promising nontoxic and widely available solar absorber. In a recent experimental study of CZTS with the Zn(O, S) buffer layer, the best-performing cell has a Zn/Sn ratio of 0.98 before annealing, different from the conventional tin-poor condition [L. Huang, et al., Sol. RRL 4, 2000010 (2020)]. A common belief is that a normal Sn content favors the formation of a SnZn antisite, which is detrimental as it produces a deep gap state. Experimentally, it is challenging to investigate the interface electronic environment with different defect profiles. We constructed a CZTS(112)-ZnS(111) interface and simulated a low concentration of oxygen by introducing it as a dopant in pure ZnS near the interface. We discovered that the OS isovalent center strongly couples with the SnZn antisite near the interface and forms various stable codoping configurations with clean gaps. As a result, a growth condition with stoichiometric Sn concentration can be restored.

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