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    Copper-doped sputtered BiSb topological insulators for field-free perpendicular magnetization switching via out-of-plane spin polarization

    Haotian Duan1, Hongna Gu1, Zeyi Zhu1, Zishuang Li1, Yi Huang1, Lina Chen2,3, Mengdi Yin1,6, Lijun Ni4, Kankan Xu5 et al.

    Xuefeng Wang5,6, Yongbing Xu5,6, Bo Liu7, Tiejun Zhou7, and Ronghua Liu1,6,*

    • *Conatact author: rhliu@nju.edu.cn

    Phys. Rev. Materials 10, 064201 – Published 2 June, 2026

    DOI: https://doi.org/10.1103/s1v5-qrtc

    Abstract

    Spin-orbit torque (SOT) magnetoresistive random-access memory (MRAM), a nonvolatile memory technology, exhibits promising prospects for advancing memory devices. However, it still faces pivotal challenges in achieving high SOT efficiency and realizing deterministic field-free switching in perpendicular magnetization SOT devices. Herein, we propose an effective strategy to realize high-efficiency field-free switching with an ultralow critical current density (Jc=3.9 MA/cm2) by doping copper (Cu) into the topological insulator (TI) Bi0.9Sb0.1 (BiSb). The cosputtered Cu-BiSb alloy film achieves a high conventional transverse spin polarization efficiency (ξy,DL=0.53). In contrast to undoped BiSb, it exhibits a significant fieldlike torque induced by spin currents with out-of-plane spin polarization (ξz,FL=0.55). This unconventional spin polarization enables deterministic field-free switching of perpendicular magnetization with as low as Jc∼4 MA/cm2 in Cu-BiSb/Pt/Co/Pt heterostructures. Our work provides critical support for the development of TI-based, high-performance, and integrable SOT-MRAM devices.

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