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Rise, fall, and rebirth of an oxide: Growth and evolution of bismuth oxide on Au(111)
Phys. Rev. Materials 10, 104008 – Published 21 October, 2026
DOI: https://doi.org/10.1103/pzgn-gqz5
Abstract
We report a comprehensive, multitechnique study of bismuth oxide growth on Au(111) under different conditions such as temperature and exposure to molecular oxygen. By combining synchrotron-based x-ray photoelectron spectroscopy and diffraction with low-energy electron diffraction and scanning tunneling microscopy, we elucidate the structural evolution of the system during controlled oxidation and subsequent annealing. We find that Bi deposition induces well-defined surface reconstructions, whereas oxidation triggers the formation of a complex sequence of bismuth oxide domains. High-resolution spectroscopic and diffraction data enable us to identify an oxide structure consistent with the (201) surface of . In addition, angle-resolved photoemission experiments and work function measurements reveal substantial electronic modifications triggered by a complex interplay of segregation of Bi and Au. Notably, a work function of 3.4 eV is achieved for oxidation at 423 K. These results provide benchmark structural and electronic insights into the Bi oxide/Au(111) system and establish a framework for integrating as a contact material in devices using two-dimensional semiconductors, where it can enable low contact resistance.
Physics Subject Headings (PhySH)
- Electrical properties
- Electronic structure
- Structural properties
- Surface states
- 2-dimensional systems
- Crystal structures
- Device fabrication
- Functional materials
- Ordered compounds
- Semiconductors
- Semimetals
- Thin films
- Angle-resolved photoemission spectroscopy
- Electron diffraction
- Epitaxy
- Film deposition
- Photoelectron diffraction
- Photoemission spectroscopy
- Sample preparation
- Scanning tunneling microscopy
- X-ray photoelectron diffraction
- X-ray photoelectron spectroscopy
Article Text
Supplemental Material
References (60)
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