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    Atomic-scale mapping of interfacial phonon modes in epitaxial YBa2Cu3O7−δ/(La,Sr)(Al,Ta)O3 thin films: The role of surface phonons

    Joaquín E. Reyes González1, Charles Zhang2, Rainni K. Chen2, John Y. T. Wei2, and Maureen J. Lagos1,*

    • *Contact author: mjlagos@mcmaster.ca

    Phys. Rev. Materials 9, 074801 – Published 7 July, 2025

    DOI: https://doi.org/10.1103/lxqy-m2y9

    Abstract

    We investigate the behavior of phonons at the epitaxial interface between YBa2Cu3O7−δ thin film and (La,Sr)(Al,Ta)O3 substrate using vibrational electron energy loss spectroscopy. Interfacial phonon modes with different degrees of scattering localization were identified. We find evidence that surface contributions from the surrounding environment can impose additional scattering modulation onto local EELS measurements at the interface. A method to remove those contributions is then used to isolate the phonon information at the interface. This work unveils interfacial phonon modes in a high-Tc cuprate superconductor, that are not accessible with traditional phonon spectroscopy techniques, and provides a method for probing interfacial phonons in complex oxide heterostructures.

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    New Insights into Functional Materials through Advanced Electron Microscopy

    The Editors of Physical Review Materials are pleased to present the Collection on New Insights into Functional Materials through Advanced Electron Microscopy, highlighting cutting-edge microscopy techniques and the extraordinary advances in materials science and engineering that they enable. The Collection is being guest-edited by Joanne Etheridge from Monash University (Australia) and Yimei Zhu from Brookhaven National Laboratory (USA). Every article published in this collection underwent a rigorous peer review process, adhering to the same high standards applied to all papers. The Physical Review Materials editorial team managed the peer review and made all editorial decisions.

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