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Reststrahlen band and optical bandgaps in semiconducting CrN films

Duc V. Dinh*, Xiang Lü, and Oliver Brandt

Dilara Sen, Olivia Fairlamb, and Frank Peiris

Farihatun Lima, Alexander Bordovalos, Suresh Chaulagain, Ambalanath Shan, and Nikolas J. Podraza

  • *Contact author: duc.vandinh@pdi-berlin.de

Phys. Rev. Materials 10, 044602 – Published 10 April, 2026Erratum Phys. Rev. Materials 10, 069902 (2026)

DOI: https://doi.org/10.1103/gt8b-1psw

Abstract

We present a comprehensive optical characterization of 200-nm-thick CrN(111) films grown simultaneously on Al2O3(0001) and AlN/Al2O3(0001) using plasma-assisted molecular beam epitaxy. Spectroscopic ellipsometry, spanning the far-infrared to ultraviolet range (0.04–5.5eV), is conducted at room temperature to determine the optical constants n and k of the films. Spectral fits reveal two interband transitions at approximately 0.35 and 0.60 eV. In the infrared range, the ellipsometry data also reveal a pronounced Reststrahlen band stemming from transversal and longitudinal optical phonons at approximately 403 and 629cm−1, respectively. The relative static and high-frequency permittivities are estimated to be about 39 and 15, respectively. A Born effective charge of approximately 2.7, extracted from the far-infrared region, indicates that CrN is partially ionic.

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Erratum

Erratum: Reststrahlen band and optical bandgaps in semiconducting CrN films [Phys. Rev. Materials 10, 044602 (2026)]

Duc V. Dinh, Xiang Lü, Oliver Brandt, Dilara Sen, Olivia Fairlamb, Frank Peiris, Farihatun Lima, Alexander Bordovalos, Suresh Chaulagain, Ambalanath Shan, and Nikolas J. Podraza
Phys. Rev. Materials 10, 069902 (2026)

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