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Synthesis and electronic characterization of Nd2−xSrxNiO4 thin films (0≤x≤1.4)

Nicole K. Taylor1,*, Dan Ferenc Segedin2,*, Ari B. Turkiewicz2, Yang Zhang3, Spencer T. Doyle2, Grace A. Pan2, Haoyue Jiang4,5, Aaron Bostwick6, Chris Jozwiak6 et al.

Eli Rotenberg6, Alessandra Lanzara4,7, Ismail El Baggari3, Charles M. Brooks2, Alpha T. N'Diaye6, Luca Moreschini4,7, and Julia A. Mundy1,2,†

  • *These authors contributed equally to this work.
  • †Contact author: mundy@fas.harvard.edu

Phys. Rev. Materials 9, L032001 – Published 7 March, 2025

DOI: https://doi.org/10.1103/PhysRevMaterials.9.L032001

Abstract

Layered nickelates have been studied extensively over the last three decades due to their structural similarities to the high-Tc superconducting cuprates. Using reactive oxide molecular beam epitaxy (MBE), we synthesize Nd2−xSrxNiO4 thin films for x=0−1.4 to probe the properties and electronic structure as a function of hole doping. The samples with lower doping show semiconducting behavior across the temperatures probed with an onset of metallic conductivity at x=1.4. We also present polarization-dependent O K and Ni L2,3 x-ray absorption spectra to track the evolution of the oxygen-nickel hybridization, distribution of holes between O 2p and Ni 3d states and the nickel oxidation state across the series. Angle-resolved photoemission spectroscopy (ARPES) measurements reveal a Fermi surface that comprises a cupratelike hole pocket of dx2−y2 character with an additional electron pocket of d3z2−r2 character at Γ. The emergence of a quasiparticle peak at the Fermi vector for x=1.4 corroborates the insulator-to-metal transition at x∼1. Finally, observe a fully two-dimensional Fermi surface with no momentum-dependent pseudogap, in contrast to measurements of the related bulk compound, Eu0.9Sr1.1NiO4.

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