- Letter
In situ study on the evolution of atomic and electronic structure of system
Phys. Rev. Materials 6, L011401 – Published 14 January, 2022
DOI: https://doi.org/10.1103/PhysRevMaterials.6.L011401
Abstract
As with other transition-metal oxide interfaces, interfaces exhibit interesting electronic properties, such as a two-dimensional electron gas. While the available Mott states and multiple pathways to metallicity in can lead to a variety of applications in oxide electronics, the origin of the different properties remains uncertain. Utilizing real-time, in situ x-ray diffraction at the synchrotron, robust but thin heterostructures were fabricated using oxide molecular beam epitaxy. A thickness of six unit cells was determined to be critical, at which point the heterostructures begin to sustain sharp, well-defined interfaces. The layers of and were sufficiently thin to benefit from the finite escape length of electrons at resonant soft x-ray photoemission, and the heterostructures were transferred in vacuo after growth to another chamber for synchrotron-based x-ray photoemission spectroscopy studies. With the x-ray energy tuned to the Ti-2p resonance, the interfaces could be probed with enough penetration depth and selectivity. It is shown that all of the heterointerfaces exhibit the two-dimensional electron gas.
Physics Subject Headings (PhySH)
Corrections
21 November, 2022
Correction: Support information in the Acknowledgment section was incomplete and has been fixed.