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Direct chemical discrimination at step edges and kink sites of sodium chloride by nc-AFM with an oxygen-terminated copper tip

Philipp Wiesener1, Saeed Amirjalayer2,*, and Harry Mönig1,†

  • *Contact author: saeed.amirjalayer@iwr.uni-heidelberg.de
  • †Contact author: harry.moenig@uni-muenster.de

Phys. Rev. Materials 10, 033804 – Published 19 March, 2026

DOI: https://doi.org/10.1103/297b-7fpm

Abstract

Since the advent of scanning probe microscopy, elemental- and chemical discrimination on heterogeneous surfaces has been a major challenge. This is mainly due to complex contrast mechanisms, which require considerable indirect structural assumptions of tip and surface and related extensive theoretical modeling. Previously, noncontact atomic force microscopy with atomically defined copper oxide tips (CuOx-tips) showed elemental selectivity on even most complex metal-oxide surfaces [Hütner et al., Science 385, 1241, 2024]. Here we report an investigation of an ionic surface, which allows to directly identify the anionic- and cationic sub lattices even on aperiodic surface structures. In line with previous work on metal oxides [Wiesener et al., ACS Nano 18, 21948, 2024], the present results extend chemically selective imaging of CuOx-tips to a new class of heterogeneous materials.

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References (43)

  1. L. Gross, F. Mohn, N. Moll, P. Liljeroth, and G. Meyer, The chemical structure of a molecule resolved by atomic force microscopy, Science 325, 1110 (2009).
  2. T. Hofmann, F. Pielmeier, and F. J. Giessibl, Chemical and crystallographic characterization of the tip apex in scanning probe microscopy, Phys. Rev. Lett. 112, 066101 (2014).
  3. B. Schulze Lammers, D. Yesilpinar, A. Timmer, Z. Hu, W. Ji, S. Amirjalayer, H. Fuchs, and H. Mönig, Benchmarking atomically defined AFM tips for chemical-selective imaging, Nanoscale 13, 13617 (2021).
  4. F. J. Giessibl, The qPlus sensor, a powerful core for the atomic force microscope, Rev. Sci. Instrum. 90, 011101 (2019).
  5. N. Pavliček, B. Schuler, S. Collazos, N. Moll, D. Pérez, E. Guitián, G. Meyer, D. Peña, and L. Gross, On-surface generation and imaging of arynes by atomic force microscopy, Nat. Chem. 7, 623 (2015).
  6. P. Hapala, M. Švec, O. Stetsovych, N. J. Van Der Heijden, M. Ondráček, J. Van Der Lit, P. Mutombo, I. Swart, and P. Jelínek, Mapping the electrostatic force field of single molecules from high-resolution scanning probe images, Nat. Commun. 7, 11560 (2016).
  7. J. N. Ladenthin, T. Frederiksen, M. Persson, J. C. Sharp, S. Gawinkowski, J. Waluk, and T. Kumagai, Force-induced tautomerization in a single molecule, Nat. Chem. 8, 935 (2016).
  8. H. Labidi, M. Koleini, T. Huff, M. Salomons, M. Cloutier, J. Pitters, and R. A. Wolkow, Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface, Nat. Commun. 8, 14222 (2017).
  9. F. Mohn, B. Schuler, L. Gross, and G. Meyer, Different tips for high-resolution atomic force microscopy and scanning tunneling microcopy of single molecules, Appl. Phys. Lett. 102, 073109 (2013).
  10. G. Kichin, C. Weiss, C. Wagner, F. S. Tautz, and R. Temirov, Single molecule and single atom sensors for atomic resolution imaging of chemically complex surfaces, J. Am. Chem. Soc. 133, 16847 (2011).
  11. A. M. Sweetman, S. P. Jarvis, H. Sang, I. Lekkas, P. Rahe, Y. Wang, J. Wang, N. Champness, L. Kantorovich, and P. Moriarty, Mapping the force field of a hydrogen-bonded assembly, Nat. Commun. 5, 3931 (2014).
  12. T. Chutora, B. De La Torre, P. Mutombo, J. Hellerstedt, J. Kopecek, P. Jelinek, and M. Svec, Nitrous oxide as an effective AFM tip functionalization: A comparative study, Beilstein J. Nanotechnol. 10, 315 (2019).
  13. D. Yesilpinar, B. Schulze Lammers, A. Timmer, Z. Hu, W. Ji, S. Amirjalayer, H. Fuchs, and H. Mönig, Mechanical and chemical interactions in atomically defined contacts, Small 17, 2101637 (2021).
  14. F. Huber, J. Berwanger, S. Polesya, S. Mankovsky, H. Ebert, and F. J. Giessibl, Chemical bond formation showing a transition from physisorption to chemisorption, Science 366, 235 (2019).
  15. M. Emmrich, F. Huber, F. Pielmeier, J. Welker, T. Hofmann, M. Schneiderbauer, D. Meuer, S. Polesya, S. Mankovsky, D. Ködderitzsch, H. Ebert, and F. J. Giessibl, Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters, Science 348, 308 (2015).
  16. L. Gross, B. Schuler, N. Pavliček, S. Fatayer, Z. Majzik, N. Moll, D. Peña, and G. Meyer, Atomic force microscopy for molecular structure elucidation, Angew. Chem. Int. Ed. 57, 3888 (2018).
  17. H. Mönig, S. Amirjalayer, A. Timmer, Z. Hu, O. Liu, L. D. Arado, M. Cnudde, C. A. Strassert, W. Ji, M. Rohlfing, and H. Fuchs, Quantitative assessment of intermolecular interactions by atomic force microscopy imaging using copper oxide tips, Nat. Nanotechnol. 13, 371 (2018).
  18. H. Mönig, Copper-oxide tip functionalization for submolecular atomic force microscopy, Chem. Commun. 54, 9874 (2018).
  19. J. I. Hütner, A. Conti, D. Kugler, F. Mittendorfer, G. Kresse, M. Schmid, U. Diebold, and J. Balajka, Stoichiometric reconstruction of the Al2O3(0001) surface, Science 385, 1241 (2024).
  20. G. Franceschi, A. Conti, L. Lezuo, R. Abart, F. Mittendorfer, M. Schmid, and U. Diebold, How water binds to microcline Feldspar (001), J. Phys. Chem. Lett. 15, 15 (2024).
  21. K. Kim, M. Abe, S. Kawai, and O. Custance, Exploring partially reduced CeO2(111) surface at the atomic scale using scanning probe microscopy, Sci. Technol. Adv. Mater. 26, 2528596 (2025).
  22. P. Wiesener, S. Förster, M. Merkel, B. S. Lammers, H. Fuchs, S. Amirjalayer, and H. Mönig, Standardization of chemically selective atomic force microscopy for metal oxide surfaces, ACS Nano 18, 21948 (2024).
  23. L. Gross, B. Schuler, F. Mohn, N. Moll, N. Pavliček, W. Steurer, I. Scivetti, K. Kotsis, M. Persson, and G. Meyer, Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips, Phys. Rev. B 90, 155455 (2014).
  24. M. Ellner, N. Pavliček, P. Pou, B. Schuler, N. Moll, G. Meyer, L. Gross, and R. Peréz, The electric field of CO tips and its relevance for atomic force microscopy, Nano Lett. 16, 1974 (2016).
  25. R. Hoffmann, D. Weiner, A. Schirmeisen, and A. S. Foster, Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface, Phys. Rev. B 80, 115426 (2009).
  26. A. J. Weymouth, M. Persson, and F. J. Giessibl, Revealing buckling of an apparently flat monolayer of NaCl on Pt(111), Phys. Rev. B 105, 035412 (2022).
  27. K. Ruschmeier, A. Schirmeisen, and R. Hoffmann, Atomic-scale force-vector fields, Phys. Rev. Lett. 101, 156102 (2008).
  28. A. Liebig, P. Hapala, A. J. Weymouth, and F. J. Giessibl, Quantifying the evolution of atomic interaction of a complex surface with a functionalized atomic force microscopy tip, Sci. Rep. 10, 14104 (2020).
  29. M. Schneiderbauer, M. Emmrich, A. J. Weymouth, and F. J. Giessibl, CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces, Phys. Rev. Lett. 112, 166102 (2014).
  30. G. Kresse and J. Furthmüller, Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set., Phys. Rev. B 54, 11169 (1996).
  31. G. Kresse and J. Furthmüller, Efficiency of ab initio total energy calculations for metals and semiconductors using a plane-wave basis set, Comput. Mater. Sci. 6, 15 (1996).
  32. See Supplemental Material at http://link.aps.org/supplemental/10.1103/297b-7fpm for a more detailed description of the experimental setup, computational details and the probe particle simulations, which include Refs. [41, 42, 43].
  33. R. Bennewitz, V. Barwich, M. Bammerlin, C. Loppacher, M. Guggisberg, A. Baratoff, E. Meyer, and H.-J. Güntherodt, Ultrathin films of NaCl on Cu(111): A LEED and dynamic force microscopy study, Surf. Sci. 438, 289 (1999).
  34. J. Repp, G. Meyer, and K.-H. Rieder, Snell's law for surface electrons: Refraction of an electron gas imaged in real space, Phys. Rev. Lett. 92, 036803 (2004).
  35. F. Schulz, J. Ritala, O. Krejčí, A. P. Seitsonen, A. S. Foster, and P. Liljeroth, Elemental identification by combining atomic force microscopy and Kelvin probe force microscopy, ACS Nano 12, 5274 (2018).
  36. R. Bolat, J. M. Guevara, P. Leinen, M. Knol, H. H. Arefi, M. Maiworm, R. Findeisen, R. Temirov, O. T. Hofmann, R. J. Maurer, F. S. Tautz, and C. Wagner, Electrostatic potentials of atomic nanostructures at metal surfaces quantified by scanning quantum dot microscopy, Nat. Commun. 15, 2259 (2024).
  37. T. Esat, D. Borodin, J. Oh, A. J. Heinrich, F. S. Tautz, Y. Bae, and R. Temirov, A quantum sensor for atomic-scale electric and magnetic fields, Nat. Nanotechnol. 19, 1466 (2024).
  38. R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, C. Loppacher, S. Schär, M. Guggisberg, E. Meyer, and A. L. Shluger, Atomically resolved edges and kinks of NaCl islands on Cu(111): Experiment and theory, Phys. Rev. B 62, 2074 (2000).
  39. S. Mishra, M. Vilas-Varela, L.-A. Lieske, R. Ortiz, S. Fatayer, I. Rončević, F. Albrecht, T. Frederiksen, D. Peña, and L. Gross, Bistability between π-diradical open-shell and closed-shell states in indeno[1,2-a]fluorene, Nat. Chem. 16, 755 (2024).
  40. P. Hapala, G. Kichin, C. Wagner, F. S. Tautz, R. Temirov, and P. Jelinek, Mechanism of high-resolution STM/AFM imaging with functionalized tips, Phys. Rev. B 90, 085421 (2014).
  41. D. Yesilpinar, B. Schulze Lammers, A. Timmer, S. Amirjalayer, H. Fuchs, and H. Mönig, High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K, Nanoscale 12, 2961 (2020).
  42. J. P. Perdew, K. Burke, and M. Ernzerhof, Generalized gradient approximation made simple., Phys. Rev. Lett. 77, 3865 (1996).
  43. S. Grimme, S. Ehrlich, and L. Goerigk, Effect of the damping function in dispersion corrected density functional theory, J. Comput. Chem. 32, 1456 (2011).

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