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The impact of interfacial chemistry on the band offset of GaAs/Ga2O3 heterostructures

Sofia Apergi1,*, Alfredo Pasquarello2, Charles Cornet1, and Laurent Pedesseau1,†

  • *Contact author: sofia.apergi@insa-rennes.fr
  • †Contact author: laurent.pedesseau@insa-rennes.fr

Phys. Rev. Materials 10, L061601 – Published 30 June, 2026

DOI: https://doi.org/10.1103/2416-zvrp

Abstract

Ga2O3/GaAs heterojunctions are emerging as promising candidates for next-generation power electronics, photonics, and energy devices, leveraging the high breakdown voltage and thermal stability of Ga2O3 alongside the mature technology, high hole mobility, and high refractive index of GaAs. The efficiency of these devices depends strongly on the band alignment between the two materials, however both type-I and type-II alignment have been reported in the literature for these heterostructures. To address this ambiguity, we use hybrid density functional theory to systematically investigate the band alignment at GaAs/Ga2O3 interfaces, focusing on the role of interface chemistry. By considering Ga-O-, As-, and As-O-rich interfaces both in amorphous and crystalline Ga2O3 phases, we demonstrate that interface stoichiometry determines the alignment type: Ga-O-rich interfaces exhibit type-II alignment with large valence band offsets (∼3.1 eV), while As-rich and As-O-rich interfaces favor type-I alignment with reduced offsets (∼2.3–2.6 eV). These trends are attributed to interface dipole formation driven by bonding configuration. Our findings provide insight into the relationship between chemistry and band alignment in GaAs/Ga2O3 heterostructures, enabling targeted optimization for specific device applications.

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