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    Thickness-dependent excitonic properties of hexagonal boron-nitride thin films

    Nguyen Van Thanh1, Nguyen Tuan Hung2,3, Hikaru Takehara4, Atsushi Taguchi5, Hsin Yi6, Pablo Solís-Fernández6,7, Hiroki Ago6, Pengfei Yang8, Lain-Jong Li9 et al.

    Kevin Lizárraga10, Riichiro Saito1,2, and Hsiang-Lin Liu1,*

    • *Contact author: hliu@ntnu.edu.tw

    Phys. Rev. Materials 9, 074010 – Published 28 July, 2025

    DOI: https://doi.org/10.1103/231t-g3mn

    Abstract

    We report the excitonic properties of hexagonal boron-nitride (h-BN) thin films as a function of thickness using deep-ultraviolet photoluminescence spectroscopy and spectroscopic ellipsometry for optical absorption analysis. The peak positions of the defect-induced donor-acceptor PL emissions and the band-to-band exciton absorption exhibit a blueshift with increasing thickness or an increase in the effective dielectric constant of the surrounding environment. The optical absorption spectra analyzed using the Elliott model, combined with renormalized band-gap calculations, reveal an exciton binding energy of 1.04 eV for monolayer h-BN, which decreases to 0.16 eV in h-BN single crystal due to environmental screening effects on the electron-hole interactions. Furthermore, both the band-gap value and Urbach energy decrease as the film thickness increases. The optical absorption coefficient derived from spectroscopic ellipsometry measurement of monolayer h-BN is directly compared with results from the first-principles GW plus Bethe-Salpeter equation calculations.

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