Nanocrystalline grains in Pd thin films imaged with high resolution automated crystal orientation and phase mapping combined with transmission electron miscroscopy. Image by A. Kobler and C. Kübel, KIT.

From the article:

Differentiation of Deformation Modes in Nanocrystalline Pd Films Inferred from Peak Asymmetry Evolution Using In Situ X-Ray Diffraction
Jochen Lohmiller, Rudolf Baumbusch, Oliver Kraft, and Patric A. Gruber
Phys. Rev. Lett. 110, 066101 (2013)

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