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Identifying Electronic Doorway States in Secondary Electron Emission from Layered Materials

A. Niggas1,*, M. Hao2, P. Richter3,4, F. Simperl1, F. Blödorn1, M. Cap1, J. Kero1, D. Hofmann1, A. Bellissimo5 et al.

J. Burgdörfer2, T. Seyller3,4, R. A. Wilhelm1, F. Libisch2,†, and W. S. M. Werner1,‡

  • *Contact author: anna@iap.tuwien.ac.at
  • †Contact author: florian.libisch@tuwien.ac.at
  • ‡Contact author: werner@iap.tuwien.ac.at

Phys. Rev. Lett. 135, 166401 – Published 15 October, 2025

DOI: https://doi.org/10.1103/qls7-tr4v

Abstract

We investigate the secondary low-energy electron emission induced by inelastic electron scattering from graphene and layered materials thereof. By applying a coincidence detection of the primary scattered and the emitted secondary electron we unravel pronounced resonance features otherwise overshadowed by the largely structureless secondary electron energy distribution. Supported by density functional theory calculations we show that these structures are the signature of prominent resonances above the vacuum threshold which originate from interlayer states acting as a doorway state for electron emission. Remarkably, some of these doorway states open up only for samples with more than five layers.

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References (30)

  1. S. Amelinckx, D. Van Dyck, J. Van Landuyt, and G. van Tendeloo, Electron Microscopy: Principles and Fundamentals (John Wiley & Sons, New York, 2008).
  2. H. Seiler, Secondary electron emission in the scanning electron microscope, J. Appl. Phys. 54, R1 (1983).
  3. T. E. Everhart and R. Thornley, Wide-band detector for micro-microampere low-energy electron currents, J. Sci. Instrum. 37, 246 (1960).
  4. D. C. Bell, Contrast mechanisms and image formation in helium ion microscopy, Microsc. Microanal. 15, 147 (2009).
  5. K. Ohya, T. Yamanaka, K. Inai, and T. Ishitani, Comparison of secondary electron emission in helium ion microscope with gallium ion and electron microscopes, Nucl. Instrum. Methods Phys. Res., Sect. B 267, 584 (2009).
  6. T. Wirtz, O. De Castro, J.-N. Audinot, and P. Philipp, Imaging and analytics on the helium ion microscope, Annu. Rev. Anal. Chem. 12, 523 (2019).
  7. C. R. Arumainayagam, H.-L. Lee, R. B. Nelson, D. R. Haines, and R. P. Gunawardane, Low-energy electron-induced reactions in condensed matter, Surf. Sci. Rep. 65, 1 (2010).
  8. E. Böhler, J. Warneke, and P. Swiderek, Control of chemical reactions and synthesis by low-energy electrons, Chem. Soc. Rev. 42, 9219 (2013).
  9. R. M. Thorman, R. Kumar T. P., D. H. Fairbrother, and O. Ingólfsson, The role of low-energy electrons in focused electron beam induced deposition: Four case studies of representative precursors, Beilstein J. Nanotechnol. 6, 1904 (2015).
  10. M. Huth, F. Porrati, C. Schwalb, M. Winhold, R. Sachser, M. Dukic, J. Adams, and G. Fantner, Focused electron beam induced deposition: A perspective, Beilstein J. Nanotechnol. 3, 597 (2012).
  11. L. Sanche, Low energy electron-driven damage in biomolecules, Eur. Phys. J. D 35, 367 (2005).
  12. L. Sanche, Nanoscopic aspects of radiobiological damage: Fragmentation induced by secondary low-energy electrons, Mass Spectrom. Rev. 21, 349 (2002).
  13. A. J. Dekker, Secondary electron emission, in Solid State Physics (Elsevier, New York, 1958), Vol. 6, pp. 251–311.
  14. J. Scholtz, D. Dijkkamp, and R. Schmitz, Secondary electron emission properties, Philips J. Res. 50, 375 (1996).
  15. A. Shih, J. Yater, C. Hor, and R. Abrams, Secondary electron emission studies, Appl. Surf. Sci. 111, 251 (1997).
  16. A. Bellissimo, G. M. Pierantozzi, A. Ruocco, G. Stefani, O. Y. Ridzel, V. Astašauskas, W. S. Werner, and M. Taborelli, Secondary electron generation mechanisms in carbon allotropes at low impact electron energies, J. Electron Spectrosc. Relat. Phenom. 241, 146883 (2020).
  17. L. Papagno and L. S. Caputi, Electronic structure of graphite: Single particle and collective excitations studied by EELS, SEE and K edge loss techniques, Surf. Sci. 125, 530 (1983).
  18. P. J. Moller and M. H. Mohamed, An experimental study of the energy dependence of the total yield due to the incidence of low-energy electrons onto graphite surfaces, J. Phys. C 15, 6457 (1982).
  19. R. F. Willis, B. Fitton, and G. S. Painter, Secondary-electron emission spectroscopy and the observation of high-energy excited states in graphite: Theory and experiment, Phys. Rev. B 9, 1926 (1974).
  20. R. F. Parodi, Multipacting, arXiv:1112.2176.
  21. P. Costa Pinto, S. Calatroni, P. Chiggiato, H. Neupert, W. Vollenberg, E. Shaposhnikova, M. Taborelli, and C. Y. Vallgren, Thin film coatings for suppressing electron multipacting in particle accelerators, in Proceedings of the 2011 Particle Accelerator Conference (JACoW, New York, NY, 2011), pp. 2096–2098, https://proceedings.jacow.org/PAC2011/papers/thobs6.pdf.
  22. F. Maeda, T. Takahashi, H. Ohsawa, S. Suzuki, and H. Suematsu, Unoccupied-electronic-band structure of graphite studied by angle-resolved secondary-electron emission and inverse photoemission, Phys. Rev. B 37, 4482 (1988).
  23. W. S. M. Werner, V. Astašauskas, P. Ziegler, A. Bellissimo, G. Stefani, L. Linhart, and F. Libisch, Secondary electron emission by plasmon-induced symmetry breaking in highly oriented pyrolytic graphite, Phys. Rev. Lett. 125, 196603 (2020).
  24. H. Yamane, H. Setoyama, S. Kera, K. K. Okudaira, and N. Ueno, Low-energy electron transmission experiments on graphite, Phys. Rev. B 64, 113407 (2001).
  25. M. Kruskopf, D. M. Pakdehi, K. Pierz, S. Wundrack, R. Stosch, T. Dziomba, M. Götz, J. Baringhaus, J. Aprojanz, C. Tegenkamp et al., Comeback of epitaxial graphene for electronics: Large-area growth of bilayer-free graphene on sic, 2D Mater. 3, 041002 (2016).
  26. J. R. Taylor, Scattering Theory: The Quantum Theory of Nonrelativistic Collisions (Dover Publications, Inc., Mineola, NY, 2012).
  27. V. A. Mandelshtam, T. R. Ravuri, and H. S. Taylor, Calculation of the density of resonance states using the stabilization method, Phys. Rev. Lett. 70, 1932 (1993).
  28. J. Müller, X. Yang, and J. Burgdörfer, Calculation of resonances in doubly excited helium using the stabilization method, Phys. Rev. A 49, 2470 (1994).
  29. K. Momma and F. Izumi, vesta 3 for three-dimensional visualization of crystal, volumetric and morphology data, J. Appl. Crystallogr. 44, 1272 (2011).
  30. V. N. Strocov, P. Blaha, H. I. Starnberg, M. Rohlfing, R. Claessen, J.-M. Debever, and J.-M. Themlin, Three-dimensional unoccupied band structure of graphite: Very-low-energy electron diffraction and band calculations, Phys. Rev. B 61, 4994 (2000).

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