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Physical Review Letters

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Journal of Applied Physics (1)Microscopy (1)jour (1)

Articles Citing

Identifying Electronic Doorway States in Secondary Electron Emission from Layered Materials

A. Niggas ^1,*, M. Hao ², P. Richter ^3,4, F. Simperl ¹, F. Blödorn ¹, M. Cap¹, J. Kero ¹, D. Hofmann ¹, A. Bellissimo ⁵ et al.

J. Burgdörfer², T. Seyller ^3,4, R. A. Wilhelm ¹, F. Libisch ^2,†, and W. S. M. Werner ^1,‡

¹Institute of Applied Physics, TU Wien, Vienna, Austria
²Institute for Theoretical Physics, TU Wien, Vienna, Austria
³Institute of Physics, Chemnitz University of Technology, Chemnitz, Germany
⁴Center for Materials, Architectures and Integration of Nanomembranes (MAIN), Chemnitz University of Technology, Chemnitz, Germany
⁵Institute of Photonics, TU Wien, Vienna, Austria

^*Contact author: anna@iap.tuwien.ac.at
^†Contact author: florian.libisch@tuwien.ac.at
^‡Contact author: werner@iap.tuwien.ac.at

Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments

Luiz H G Tizei, Yves Auad, Florian Castioni, and Mathieu Kociak

Microscopy 75 129 (2026)

Theoretical investigation of thermionic electron emission from semiconductors and insulators and mean escape probability of internal secondary electrons

Xiang Li, Hong-Kun Lu, Ai-Gen Xie, Yi-Kang Xu, Hao Feng, and Lu Wang

Journal of Applied Physics 139 145705 (2026)

Critical mass ratio and phase transition in three-particle lattice systems: comparison of bosonic and fermionic cases

J. I. Abdullaev, A. I. Eshniyozov, and M. V. Dolgopolov

jour 17 179 (2026)

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ISSN 1079-7114 (online), 0031-9007 (print).

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