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    Enhanced sensitivity to trace U238 impurity of sapphire via coincidence neutron activation analysis

    D. Chernyak1,*,†, I. J. Arnquist2, T. Daniels3, S. W. Finch4, L. Hissong5, M. Hughes1, R. MacLellan5, A. Piepke1, A. Pocar6 et al.

    R. Roshong5, R. Saldanha2, and R. H. M. Tsang1,‡

    • *Contact author: Dima@awa.tohoku.ac.jp
    • †Present address: Research Center for Neutrino Science, Tohoku University, Sendai 980-8578, Japan.
    • ‡Present address: Canon Medical Research USA, Inc.

    Phys. Rev. C 113, 015803 – Published 9 January, 2026

    DOI: https://doi.org/10.1103/zgzm-w5f4

    Abstract

    Sapphire has mechanical and electrical properties that are advantageous for the construction of internal components of radiation detectors such as time projection chambers and bolometers. However, it has proved difficult to assess its Th232 and U238 content down to the picogram per gram level. This work reports an experimental verification of a computational study that demonstrates γγcoincidencecounting, coupled with neutron activation analysis (NAA), can reach ppt sensitivities. Combining results from γγcoincidencecounting with those of earlier single-γ counting based NAA shows that a sample of Saint Gobain sapphire has Th232 and U238 concentrations of <0.26ppt and <2.3 ppt, respectively; the best constraints on the radiopurity of sapphire.

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