Skip to Main Content

All Journals Physics Magazine

All Journals Physics Magazine

Highlights
Recent
Accepted
Collections
Authors
Referees
Editorial Policies
Press
About
Editorial Team
RSS

Physical Review B

Highlights
Recent
Accepted
Collections
Authors
Referees
Editorial Policies
Press
About
Editorial Team
RSS

Filter

1 - 2 of 2 Results

Journal

ALL

J Mater Sci: Mater Electron (1)Phys. Rev. B (1)

Articles Citing

Imaging surface topography with coherent x-ray reflectivity: Theory, kinematics, and simulations

Irene Calvo-Almazán ^1,2, Anusheela Das ³, Ana F. Suzana³, Fernando Bartolomé ^1,2, and Paul Fenter ^3,*

¹Departamento de Física de la Materia Condensada, Universidad de Zaragoza, Zaragoza 50009, Spain
²Instituto de Nanociencia y Materiales de Aragón, CSIC-Universidad de Zaragoza, Zaragoza 50009, Spain
³Chemical Sciences and Engineering Division, Argonne National Laboratory, Lemont, Illinois 60439, USA

^*Contact author: fenter@anl.gov

Coherent x-ray interfacial imaging of microparticles and extended surfaces

Anusheela Das, Irene Calvo-Almazán, Ana Suzana, Anna Wanhala, Steven Leake, and Paul Fenter

Phys. Rev. B 114 225405 (2026)

X-ray reflectivity and spectroscopic ellipsometry investigation of magnetron-sputtered (111)-textured Gd-doped NiO thin films for optoelectronic applications

Anam Ayub Tahami, Ali Tahir, Qurat ul Ain, Arzoo Fatima, Iqra Tehseen, and Muhammad Ahsan Iqbal

J Mater Sci: Mater Electron 37 2166 (2026)

Select page:

1

Physical Review B

Sign up for email alerts

Explore the Journal

Home
Current
All Issues
News & Announcements
About
Editorial Team

Journal

Home Current All Issues News & Announcements About Editorial Team

News Join APS

Authors

General Information Submit a Manuscript Publication Rights Open Science Policies & Practices Tips for Authors Professional Conduct

Reviewers

General Information Submit a Report Update Your Information Policies & Practices Reviewer FAQ Guidelines for Reviewers Outstanding Referees

Librarians

General Information Subscriptions Online License Agreement Usage Statistics Your Account

Students

Physics PhysicsCentral Student Membership

Connect

Privacy Policies Contact Information Feedback

Authors

General Information
Submit a Manuscript
Publication Rights
Open Science
Policies & Practices
Tips for Authors
Professional Conduct

Reviewers

General Information
Submit a Report
Update Your Information
Policies & Practices
Reviewer FAQ
Guidelines for Reviewers
Outstanding Referees

Librarians

General Information
Subscriptions
Online License Agreement
Usage Statistics
Your Account

Students

Physics
PhysicsCentral
Student Membership

Connect

Privacy
Policies
Contact Information
Feedback

ISSN 2469-9969 (online), 2469-9950 (print).

©2026 American Physical Society. All rights reserved.

Physical Review B™ is a trademark of the American Physical Society, registered in the United States, Canada, European Union, and Japan. The APS Physics logo and Physics logo are trademarks of the American Physical Society. Information about registration may be found here. Use of the American Physical Society websites and journals implies that the user has read and agrees to our Terms and Conditions and any applicable Subscription Agreement.

Sign In to Your Journals Account

Username

Password

Forgot your username/password?
Create an account
Sign in to your APS Member Account
Sign in via your Institution

Filter

Filter

Article Lookup

Enter a citation

Paste a citation or DOI

Journal

Volume

Article ID / page number