Charge transport in superconducting junctions at finite voltages is governed by Andreev reflections, including multiple Andreev reflections, which are processes that enable multiple charge transfer, a hallmark that shot noise can directly quantify. Since the effective charge extracted from shot noise measurements varies with the transparency of the junction, systematic control of transparency is essential but experimentally challenging. Here, we present shot noise scanning tunneling microscopy measurements enabled by a newly developed amplifier, allowing access to different transparency regimes. We perform shot noise measurements on Pb(111) with tunable transparency at 2.2 K and observe that the shot noise evolves from a single electron tunneling regime to multiple charge transfer regime as transparency increases. Our results are quantitatively consistent with theoretical simulations of Andreev reflections and multiple Andreev reflections for a single-channel system. These results establish junction transparency as the key parameter governing the evolution of charge transport and demonstrate that noise-STM is a powerful platform for investigating microscopic charge transport mechanisms with controlled junction transparency at the atomic scale.