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    Interplay of flat-band and Anderson localization in disordered moiré superlattices

    Qian Liu1, Xiaoshuang Xia1, Junjie Wang1, Peilong Hong2,3,*, Lei Xu4,†, Lujun Huang5, Daohong Song3, and Yi Liang1,‡

    • 1Guangxi Key Laboratory for Relativistic Astrophysics, Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, Guangxi 530004, China
    • 2School of Mathematics and Physics, Anqing Normal University, Anqing, Anhui 246133, China
    • 3The MOE Key Laboratory of Weak-Light Nonlinear Photonics, School of Physics and TEDA Applied Physics Institute, Nankai University, Tianjin 300457, China
    • 4Advanced Optics and Photonics Laboratory, Department of Engineering, School of Science and Technology, Nottingham Trent University, Nottingham NG11 8NS, United Kingdom
    • 5School of Physics and Electronic Science, East China Normal University, Shanghai 200241, China

    • *Contact author: p.l.hong@aqnu.edu.cn
    • †Contact author: lei.xu@ntu.ac.uk
    • ‡Contact author: liangyi@gxu.edu.cn

    Phys. Rev. B 114, 144202 – Published 9 September, 2026

    DOI: https://doi.org/10.1103/zdy6-y6bt

    Abstract

    Disorder in moiré superlattices simultaneously degrades flat-band localization and induces Anderson localization, yet how these two regimes interact has remained unclear. Here, we introduce a combined framework linking localization‐length scaling with differential probability density analysis to map localization transitions in partially disordered one‐dimensional silicon moiré lattices. It is found that flat bands confined within the interband gap keep their strong localization even as disorder grows. In contrast, flat bands intersecting dispersive bands exhibit rich behaviors: the low‐frequency branch undergoes an inverse Anderson transition, while the high‐frequency branch supports coexisting flat-band and Anderson localization at strong disorder. Our results deliver direct evidence of competing localization mechanisms in disordered moiré systems and offer guiding principles for engineering robust, nonideal moiré photonic devices.

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