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Numerical simulation of charged-defect-induced decoherence in conveyor-mode spin qubit shuttling in Si/SiGe

Nils Ciroth1, Arnau Sala1, Ran Xue1, Lasse Ermoneit2, Thomas Koprucki2, Markus Kantner2, and Lars R. Schreiber1,3,*

  • *Contact author: lars.schreiber@physik.rwth-aachen.de

Phys. Rev. B 114, 105305 – Published 19 August, 2026

DOI: https://doi.org/10.1103/styv-ypg9

Abstract

Recent advances in coherent conveyor-mode spin qubit shuttling are paving the way for large-scale quantum computing platforms with qubit connectivity achieved by spin qubit shuttles. We developed a simulation tool to investigate numerically the impact of device imperfections on the spin coherence of conveyor-mode shuttling in Si/SiGe. We simulate the quantum evolution of a mobile electron spin qubit under the influence of sparse and singly charged point defects placed in the Si/SiGe heterostructure in close proximity to the shuttle lane. We consider different locations of a single charge defect with respect to the center of the shuttle lane, multiple orbital states of the electron in the shuttle with g-factor differences between the orbital levels, and orbital relaxation induced by electron-phonon interaction. Our analysis isolates spin decoherence arising from orbital excitations induced by charged defects in close proximity of the shuttled electron. With this simulation framework, we quantify the impact of individual charged defects on qubit coherence and determine the range of defect densities compatible with high-fidelity conveyor-mode spin shuttling.

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