Charge dynamics at nitrogen impurities and nitrogen-vacancy centers in diamond
Phys. Rev. B 114, 194104 – Published 8 October, 2026
DOI: https://doi.org/10.1103/smp1-21fs
Abstract
The nitrogen-vacancy (NV) center in diamond is the prototype quantum defect that enables a variety of diamond-based quantum technologies. However, charge-state instability and spectral diffusion, often induced by substitutional nitrogen impurities (), remain key challenges for device performance. Here, we employ first-principles density functional theory calculations to quantitatively investigate nonradiative carrier capture processes mediated by multiphonon emission at both the NV center and the impurity. For relevant cases, we also compute the rates of radiative and thermal emission processes. For , we obtain an electron capture coefficient of at 300 K. Both the magnitude and the temperature dependence are in excellent agreement with experimentally measured capture cross sections. Electron capture at is even faster, with a capture coefficient of at 300 K. For the NV center, we find that carrier capture rates involving only the ground states of and are negligibly slow. However, capture into the excited states ( and ) is significantly faster. In particular, the capture coefficient for the hole capture process is as large as and largely temperature independent. Hole capture at will thus occur via nonradiative capture into an excited state of followed by fast radiative decay to the ground state. Similarly, electron capture at will occur via the pathway, but with a lower nonradiative capture coefficient ( at 300 K). Our calculated capture coefficients and rates provide essential information for analyzing charge-state dynamics.