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    Effective perpendicular electric field as a probe for interlayer pairing in ambient-pressure superconducting La2.85Pr0.15Ni2O7 thin films

    Junkang Huang1 and Tao Zhou1,2,*

    • 1Guangdong Basic Research Center of Excellence for Structure and Fundamental Interactions of Matter, Guangdong Provincial Key Laboratory of Quantum Engineering and Quantum Materials, School of Physics, South China Normal University, Guangzhou 510006, China
    • 2Guangdong-Hong Kong Joint Laboratory of Quantum Matter, Frontier Research Institute for Physics, South China Normal University, Guangzhou 510006, China

    • *Contact author: tzhou@scnu.edu.cn

    Phys. Rev. B 112, 054506 – Published 7 August, 2025

    DOI: https://doi.org/10.1103/rm9g-8lm1

    Abstract

    Recent angle-resolved photoemission spectroscopy (ARPES) experiments on La2.85Pr0.15Ni2O7 thin films revealed a superconducting gap near the diagonal direction for the dx2−y2 orbital, confined to a narrow momentum region. Our numerical calculations indicate that interlayer pairing is dominant, resulting in an s±-wave symmetry. We propose employing perpendicular electric fields, a practical method in thin-film systems, to verify the pairing symmetry. Our calculations predict that such fields will induce Fermi arcs or nodal points and significantly modulate the gap near the diagonal, with the modulated region overlapping the area probed by ARPES. This approach provides an effective tool for probing pairing symmetry in bilayer nickelate thin films, especially given current limitations in experimental techniques.

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