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    Ab initio study of carrier mobility in Bi2O2Se

    Yubo Yuan1,2,3, Ziye Zhu2,3, Jiaming Hu2,3, and Wenbin Li2,3,*

    • 1School of Materials Science and Engineering, Zhejiang University, 310027 Hangzhou, China
    • 2Department of Materials Science and Engineering, Westlake University, 310030 Hangzhou, China
    • 3Key Laboratory of 3D Micro/Nano Fabrication and Characterization of Zhejiang Province, School of Engineering, Westlake University, 310030 Hangzhou, China

    • *Contact author: liwenbin@westlake.edu.cn

    Phys. Rev. B 113, 115204 – Published 11 March, 2026

    DOI: https://doi.org/10.1103/pj8c-qwmc

    Abstract

    Bi2O2Se is an emerging high-performance layered semiconductor with excellent stability. While experimental studies have explored carrier transport across various doping levels for both n-type and p-type conduction, a comprehensive theoretical understanding remains incomplete. In this work, we present parameter-free first-principles calculations of the electron and hole mobilities in Bi2O2Se, based on iterative solution of the Boltzmann transport equation that includes electron-phonon scattering and ionized impurity scattering on an equal footing. Intriguingly, we find that Bi2O2Se exhibits high electron mobilities in both the in-plane and out-of-plane directions, whereas the hole mobilities are only significant in the in-plane direction, displaying a unique three-dimensional electron transport and two-dimensional hole transport behavior. At 300 K, the calculated intrinsic electron and hole mobilities along the in-plane direction are 447 cm2V−1s−1 and 29 cm2V−1s−1, respectively, which are primarily affected by Fröhlich electron-phonon interactions. Due to its large static dielectric permittivity, Bi2O2Se exhibits exceptionally high low-temperature electron mobilities above 1.0×105cm2V−1s−1, and its electron mobilities above 50 K are robust against ionized impurity scattering over a wide range of impurity concentrations. By incorporating the Hall effect into our analysis, we predict an in-plane electron Hall mobility of 517 cm2V−1s−1 at 300 K, in excellent agreement with experimental data. These results provide valuable insights into the carrier transport mechanisms in Bi2O2Se, and offer predictive benchmarks for future theoretical and experimental investigations.

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