Structural evolution and continuous band-gap narrowing in layered-like framework under pressure
Phys. Rev. B 114, 214102 – Published 5 October, 2026
DOI: https://doi.org/10.1103/hx9l-y2xj
Abstract
is a Cu-based rare-earth chalcogenide semiconductor whose structural robustness and pressure-dependent electronic evolution remain largely unexplored. Here, we investigate its structural, optical, and transport properties under compression by combining high-pressure experiments with first-principles calculations. retains its monoclinic structure up to 70.1 GPa without the emergence of a phase transition. Nevertheless, compression induces subtle local structural reorganization, including Cu-site disordering-to-ordering and an anisotropic lattice anomaly near 5.0 GPa associated with flattening of the corrugated corner-sharing layers. Concurrently, the optical band-gap decreases continuously from 2.39 to 0.93 eV upon compression to 48.6 GPa, accompanied by distinct piezochromism and a progressive redshift of the photoluminescence emission. First-principles calculations reveal that the band-gap narrowing originates from the continuous evolution of the Cu derived valence states and La derived conduction states under compression. Electrical transport measurements show that remains semiconducting up to 64.1 GPa, while photocurrent retains the same polarity throughout the investigated pressure range. These results establish as an unusual pressure-robust semiconductor in which substantial band-edge engineering is achieved through continuous local structural evolution without a phase transformation, providing a model system for exploring pressure-induced electronic tuning in Cu-based rare-earth chalcogenides.