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    Transverse resistance due to electronic inhomogeneities in superconductors

    Shamashis Sengupta1,*, Alireza Farhadizadeh2,†, Joe Youssef1, Sara Loucif1, Florian Pallier1, Louis Dumoulin1, Kasturi Saha3, Sumiran Pujari4, Magnus Óden2 et al.

    Claire Marrache-Kikuchi1 and Miguel Monteverde5,‡

    • *Contact author: shamashis.sengupta@ijclab.in2p3.fr
    • †Contact author: alireza.farhadizadeh@liu.se
    • ‡Contact author: miguel.monteverde@universite-paris-saclay.fr

    Phys. Rev. B 112, 014514 – Published 18 July, 2025

    DOI: https://doi.org/10.1103/bgbf-b39l

    Abstract

    Typical length scales associated with superconductivity are in the range of nanometers. Accordingly, measurements of electrical resistance over much larger distances are supposed to be insensitive to details of spatial inhomogeneities of superconducting order. We observe that current paths adopt a highly nonuniform distribution at the onset of the superconducting transition which is manifested in the development of a finite transverse resistance. The anisotropic distribution of current density indicates the emergence of electronic inhomogeneities perceivable over macroscopic distances, characterized by a length scale which is unrelated to the structural properties of the superconducting films. Our experiments reveal the ubiquitous nature of this phenomenon in conventional superconductors.

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