Nonuniversal critical exponents for the superconducting critical current in lead thin films
Phys. Rev. B 49, 674 – Published 1 January, 1994
DOI: https://doi.org/10.1103/PhysRevB.49.674
Abstract
We present experimental results on electrical measurements of evaporated thin lead films (inverse swiss cheese model) and ion-milled thin films (swiss cheese model) at liquid-helium temperatures near the superconductor-insulator percolation threshold. We provide evidence for the nonuniversality of the critical exponents for the critical current in two dimensions for the two systems studied, in good agreement with theoretical results.