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Magnetic penetration depth of κ-(BEDT-TTF)2Cu[N(CN)2]Br, determined from the reversible magnetization

M. Lang, N. Toyota, T. Sasaki, and H. Sato

  • Institute for Materials Research, Tohoku University, Sendai 980, Japan

Phys. Rev. B 46, 5822(R) – Published 1 September, 1992

DOI: https://doi.org/10.1103/PhysRevB.46.5822

Abstract

We present results of the dc magnetization of single-crystalline κ-(BEDT-TTF)2Cu[N(CN)2]Br. From the slope of the linear M(lnH) dependence of the reversible magnetization, the magnetic penetration depth λ(T) is estimated. At low temperatures, λ(T) shows only a weak T dependence, consistent with conventional pairing. For the in-plane London penetration depth we find λL(0)=(650±20) nm. Small deviations from a pure BCS behavior indicate some tendency towards intermediate or strong-coupling and/or a somewhat reduced carrier mean free path.

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