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Structural characterization of Fe/Cu multilayers by x-ray absorption spectroscopy

S. Pizzini, F. Baudelet, D. Chandesris, A. Fontaine, and H. Magnan

J. M. George, F. Petroff, A. Barthélemy, and A. Fert

R. Loloee and P. A. Schroeder

  • Laboratoire pour l’Utilisation du Rayonnement Électromagnétique, Université Paris-Sud, 91405 Orsay, France

  • Laboratoire de Physique des Solides, Université Paris-Sud, 91450 Orsay, France

  • Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, Michigan 48824

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Phys. Rev. B 46, 1253(R) – Published 1 July, 1992

DOI: https://doi.org/10.1103/PhysRevB.46.1253

Abstract

The local structure of Fe/Cu multilayers prepared by sputtering is studied by x-ray absorption spectroscopy (XAS). We find that thin Cu layers grow with the bcc structure imposed by the Fe layers. For larger thicknesses, the Cu films are more disordered and beyond 13 Å the films relax to fcc structure. The thickness dependence of the magnetoresistance of the multilayers is discussed in the light of the XAS results.

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Phys. Rev. B 46, 1253(R)– Published 1 July, 1992
  • Received 13 April 1992

© 1992 American Physical Society

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