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    Magnetic Freezeout and Impact Ionization in GaAs

    T. O. Poehler

    • Applied Physics Laboratory, The Johns Hopkins University, Silver Spring, Maryland 20910

    Phys. Rev. B 4, 1223 – Published 15 August, 1971

    DOI: https://doi.org/10.1103/PhysRevB.4.1223

    Abstract

    Low-temperature measurements of impurity effects have been conducted in n-type GaAs with impurity concentrations of the order of (1-3) × 1015 cm−3. The behavior of these materials in strong magnetic fields is well described by a recently developed theory which characterizes the impurity level with a broadened energy distribution and the conduction band with a Gaussian-like tail. The reduced impurity ionization energies in strongly doped materials are explained in terms of this model. Electric field ionization of these impurity levels in strong magnetic fields was found to be consistent with the model and recent theories of impact-ionization phenomena.

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