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Genuine and faux single G centers in carbon-implanted silicon

Alrik Durand1,*, Yoann Baron1,*, Félix Cache1, Tobias Herzig2, Mario Khoury3, Sébastien Pezzagna2, Jan Meijer2, Jean-Michel Hartmann4, Shay Reboh4 et al.

Marco Abbarchi3,5, Isabelle Robert-Philip1, Jean-Michel Gérard6, Vincent Jacques1, Guillaume Cassabois1,7, and Anaïs Dréau1,†

  • *These authors contributed equally to this work.
  • †Contact author: anais.dreau@umontpellier.fr

Phys. Rev. B 110, L020102 – Published 10 July, 2024

DOI: https://doi.org/10.1103/PhysRevB.110.L020102

Abstract

Among the wide variety of single fluorescent defects investigated in silicon, numerous studies have focused on color centers with a zero-phonon line around 1.28µm and identified to a common carbon complex in silicon, namely the G center. However, inconsistent estimates regarding their quantum efficiency cast doubt on the correct identification of these individual emitters. Through a comparative analysis of their single-photon emission properties, we demonstrate that these single color centers are split in two distinct families of point defects. A first family consists of the genuine single G centers with a well-identified microscopic structure and whose photoluminescence has been investigated on ensemble measurements since the 1960s. The remaining defects belong to another color center, which we will refer to as the G★ center, whose atomic configuration has yet to be determined. These results provide a safeguard against future defect misidentifications, which is crucial for further development of quantum technologies relying on G or G★ center quantum properties.

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