Export citation

Export citation

Choose format for download:

Download Citation
  • Letter

Nonlocal sidewall response and deviation from exact quantization of the topological magnetoelectric effect in axion-insulator thin films

N. Pournaghavi1, A. Pertsova2, A. H. MacDonald3, and C. M. Canali1

  • 1Department of Physics and Electrical Engineering, Linnæus University, 391 82 Kalmar, Sweden
  • 2Nordita, KTH Royal Institute of Technology and Stockholm University, Roslagstullsbacken 23, SE-106 91 Stockholm, Sweden
  • 3Department of Physics, University of Texas at Austin, Texas 78712, USA

Phys. Rev. B 104, L201102 – Published 5 November, 2021

DOI: https://doi.org/10.1103/PhysRevB.104.L201102

Abstract

Topological insulator (TI) thin films with surface magnetism are expected to exhibit a quantized anomalous Hall effect (QAHE) when the magnetizations on the top and bottom surfaces are parallel, and a quantized topological magnetoelectric effect (QTME) when the magnetizations have opposing orientations (axion-insulator phase) and the films are sufficiently thick. We present a unified picture of both effects that associates deviations from exact quantization of the QTME caused by finite thickness with nonlocality in the sidewall current response function. Using realistic tight-binding model calculations, we show that in Bi2Se3 TI thin films, deviations from quantization in the axion-insulator phase are reduced in size when the exchange coupling of tight-binding model basis states to the local magnetization near the surface is strengthened. Stronger exchange coupling also reduces the effect of potential disorder, which is unimportant for the QAHE but detrimental for the QTME, which requires that the Fermi energy lie inside the gap at all positions.

Physics Subject Headings (PhySH)

Authorization Required

We need you to provide your credentials before accessing this content.

Supplemental Material (Subscription Required)

References (Subscription Required)

Outline

Information

Sign In to Your Journals Account

Filter

Filter

Article Lookup

Enter a citation