Export citation

Export citation

Choose format for download:

Download Citation
  • Letter

Ultrafast hot-carrier relaxation in silicon monitored by phase-resolved transient absorption spectroscopy

Martin Wörle1, Alexander W. Holleitner1,2, Reinhard Kienberger1, and Hristo Iglev1,*

  • 1Physik-Department, Technische Universität München, James-Frank-Straße 1, 85748 Garching, Germany
  • 2Munich Center for Quantum Science and Technology (MCQST), Schellingstrasse 4, 80799 München, Germany

  • *hristo.iglev@ph.tum.de

Phys. Rev. B 104, L041201 – Published 12 July, 2021

DOI: https://doi.org/10.1103/PhysRevB.104.L041201

Abstract

The relaxation dynamics of hot carriers in silicon (100) is studied via a holistic approach based on phase-resolved transient absorption spectroscopy with few-cycle optical pulses. After excitation by a sub-5-fs light pulse, strong electron-electron coupling leads to an ultrafast single electron momentum relaxation time of 10 fs. The thermalization of the hot carriers is visible in the temporal evolution of the effective mass and the collision time as extracted from the Drude model. The optical effective mass decreases from 0.3me to about 0.125me with a time constants of 58 fs, while the collision time increases from 3 fs for the shortest timescales with a saturation at approximately 18 fs with a time constant of 150 fs. The observation shows that both Drude parameters exhibit different dependences on the carrier temperature. The presented information on the electron mass dynamics as well as the momentum-, and electron-phonon scattering times with unprecedented time resolution is important for all hot-carrier optoelectronic devices.

Physics Subject Headings (PhySH)

Authorization Required

We need you to provide your credentials before accessing this content.

Supplemental Material (Subscription Required)

References (Subscription Required)

Outline

Information

Sign In to Your Journals Account

Filter

Filter

Article Lookup

Enter a citation