Significant tunneling electroresistance and ultralow resistance-area product in asymmetric ferroelectric tunnel junctions
Phys. Rev. B 112, 245414 – Published 15 December, 2025
DOI: https://doi.org/10.1103/6f3j-6zbm
Abstract
Conventional ferroelectric tunnel junctions (FTJs) face inherent limitations in simultaneously achieving both a high tunneling electroresistance ratio (TER) and a low resistance-area product (RAP), hindering high-density, low-power, nonvolatile memory applications. This study overcomes this challenge by designing asymmetric FTJs based on a two-dimensional heterostructure. Utilizing first-principles calculations with quantum transport simulations, we demonstrate that ferroelectric polarization switching in reversibly modulates the heterostructure's band alignment between type-III (metallic) and type-II (semiconducting) states. Exploiting this, we engineered asymmetric and electrodes flanking a central barrier. The asymmetric FTJ achieves a TER of , which is 5 orders of magnitude higher than that of symmetric FTJs (), while maintaining an ultralow RAP of . Crucially, these optimal performance metrics (TER , ) persist robustly even under variations in channel width ( to , ) or electrode doping concentration (5%–15%). These findings highlight the superior performance and exceptional robustness of the asymmetric -based FTJ, which holds significant promise for high-density, low-power, nonvolatile memory applications.