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    Asymmetric ultrafast carrier relaxation in β−TeO2: Phonon bottleneck driven electron-hole imbalance

    Peiran Zhang1, Longjuan Kong1,2,3,*, and Jiayu Dai1,2,3,†

    • *Contact author: konglj@nudt.edu.cn
    • †Contact author: jydai@nudt.edu.cn

    Phys. Rev. B 113, 134311 – Published 20 April, 2026

    DOI: https://doi.org/10.1103/5ygd-9hmz

    Abstract

    β−TeO2 has emerged as a promising wide-band-gap semiconductor for next-generation optoelectronic devices, owing to its exceptionally high hole mobility and excellent nonlinear optical properties. However, while static characteristics are well-studied, the ultrafast dynamics of photogenerated carriers—critical for device efficiency—remain poorly understood. Here, we employ ab initio nonadiabatic molecular dynamics within a surface-hopping framework to investigate the relaxation processes of electrons and holes in β−TeO2. Our simulations reveal a significant asymmetry: Hole relaxation occurs on a subpicosecond timescale (0.199 ps), an order of magnitude faster than electron relaxation (2.76 ps). This imbalance, which can limit the performance of light-emitting devices, is traced to fundamental differences in relaxation pathways. Electrons near the conduction band edge encounter sparse intermediate states, leading to weak nonadiabatic coupling and a phonon bottleneck, whereas holes benefit from dense valence-band states coupled to high-frequency phonons, facilitating rapid transitions. Furthermore, cooling to 100 K suppresses carrier dynamics due to reduced phonon excitation yet preserves the asymmetry. Our work uncovers the microscopic origins of carrier relaxation asymmetry in β−TeO2 and provides a predictive framework for optimizing optoelectronic functionality through external stimuli such as temperature and pressure.

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